M. Redford

Dynamic recovery of negative bias temperature instability in <i>p</i>-type metal–oxide–semiconductor field-effect transistors

M. Ershov, Sharad Saxena, H. Karbasi et al. · Applied Physics Letters · 2003 · 161 citations

Engineering, Electrical Engineering, Microelectronics +15

Transient effects and characterization methodology of negative bias temperature instability in pMOS transistors

M. Ershov, R. Lindley, Sharad Saxena et al. · 2003 · 37 citations

Engineering, Electrical Engineering, Electronic Materials +16

Degradation dynamics, recovery, and characterization of negative bias temperature instability

M. Ershov, Sharad Saxena, S. Minehane et al. · Microelectronics Reliability · 2004 · 24 citations

Engineering, Materials Engineering, Materials Science +7

Analysis of mixed-signal manufacturability with statistical technology CAD (TCAD)

D.A. Hanson, Ronald Goossens, M. Redford et al. · IEEE Transactions on Semiconductor Manufacturing · 1996 · 21 citations

Engineering, Electrical Engineering, Manufacturing Engineering +17

Test structures and analysis techniques for estimation of the impact of layout on MOSFET performance and variability

Sharad Saxena, S. Minehane, Jianjun Cheng et al. · 2004 · 15 citations

Engineering, Computer Engineering, Electrical Engineering +17