<title>Thick photoresist imaging using a three-wavelength exposure stepper</title>

Bradley Todd, Warren W. Flack, Sylvia White

Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE · 1999 · 14 citations · 6 references

Concepts

Abstract

Images formed in thick photosensitive materials are widely used as electroplating molds for micro-electromechanical (MEMS) part and other electronic applications such as bump bonding, thin film heads and multichip module manufacturing. The expansion of traditional microelectronic lithography into very thick photoresists present a technical challenge for stepper manufacturers that have traditionally attempted to optimize resolution and depth of focus for thin photoresist systems. Stepper optics and illumination needs to be re-optimized for the best performance in thick photosensitive materials.

References

6