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Publications
2
Citations
27
H-Index
Active since
1999
Bradley Todd is an author specializing in optical lithography, materials engineering, and photoresists.
Publications per year
1999–1999
<title>Thick photoresist imaging using a three-wavelength exposure stepper</title>
Bradley Todd, Warren W. Flack, Sylvia White · Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE · 1999 · 14 citations
Engineering, Materials Engineering, Materials Science +16
Process characterization of one hundred micron thick photoresist films
Warren W. Flack, Sylvia White, Bradley Todd · Proceedings of SPIE, the International Society for Optical Engineering · 1999 · 13 citations
Engineering, Materials Engineering, Materials Science +14
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