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Publications
4
Citations
55
H-Index
Active since
1998
Sylvia White is an author specializing in photoresists, materials engineering, and microfabrication.
Publications per year
1998–1999
The optimization and characterization of ultra-thick photoresist films
Warren W. Flack, Warren P. Fan, Sylvia White · Advances in resist technology and processing. Conference · 1998 · 15 citations
Engineering, Materials Engineering, Materials Science +17
<title>Thick photoresist imaging using a three-wavelength exposure stepper</title>
Bradley Todd, Warren W. Flack, Sylvia White · Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE · 1999 · 14 citations
Engineering, Materials Engineering, Materials Science +16
Optimization and characterization of ultrathick photoresist films
Warren W. Flack, Warren P. Fan, Sylvia White · Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE · 1998 · 13 citations
Natural Sciences, Materials Engineering, Materials Science +16
Process characterization of one hundred micron thick photoresist films
Warren W. Flack, Sylvia White, Bradley Todd · Proceedings of SPIE, the International Society for Optical Engineering · 1999 · 13 citations
Engineering, Materials Engineering, Materials Science +14
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