Concepedia

Reliability of large periphery GaN-on-Si HFETs

Sameer Singhal, T. Li, A. Chaudhari, A.W. Hanson, R. Therrien, J. W. Johnson, W. Nagy, J. Marquart, P. Rajagopal, J. C. Roberts,

Microelectronics Reliability · 2006 · 88 citations · 6 references

Concepts

EngineeringElectrical EngineeringMaterials ScienceElectronic MaterialsSemiconductor DevicesSemiconductor MaterialsDevice ReliabilitySemiconductor Device MaterialsSemiconductor PhysicsSemiconductor ReliabilityWide-bandgap Semiconductor DevicesWide-bandgap SemiconductorsGallium Nitride (Gan) MaterialsGate Oxide ReliabilityReliability Degradation

References

6

12 W/mm AlGaN–GaN HFETs on Silicon Substrates

J. W. Johnson, E. L. Piner, Andrei Vescan et al. · IEEE Electron Device Letters · 2004 · 223 citations

Engineering, Electrical Engineering, Materials Science +17

GaN-ON-Si Failure Mechanisms and Reliability Improvements

Sameer Singhal, J. C. Roberts, P. Rajagopal et al. · 2006 · 60 citations

Engineering, Electrical Engineering, Materials Science +17

150 W GaN-on-Si RF Power Transistor

W. Nagy, Sameer Singhal, R. Borges et al. · IEEE MTT-S International Microwave Symposium Digest, 2005. · 2005 · 51 citations

Engineering, Electrical Engineering, Materials Science +17

Material, process, and device development of GaN-based HFETs on silicon substrates

J. W. Johnson, Ji‐Xing Gao, K. Lucht et al. · 2004 · 34 citations

Engineering, Materials Engineering, Materials Science +17

Reliability of metamorphic HEMTs on GaAs substrates

P.F. Marsh, C.S. Whelan, W. E. Hoke et al. · Microelectronics Reliability · 2002 · 30 citations

Engineering, Electrical Engineering, Materials Science +11