Analysis of carrier generation lifetime in strained-Si/SiGe heterojunction MOSFETs from capacitance transient

L. K. Bera, Shajan Mathew, N. Balasubramanian, G. Braithwaite, M. T. Currie, F. Singaporewala, Jee-Hoon Yap, R. Hammond, Anthony Lochtefeld, Mayank T. Bulsara,

Applied Surface Science · 2003 · 16 citations · 16 references

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