Tungsten Interconnects

Tungsten Interconnects is a type of integrated circuit interconnect technology in which tungsten is used as the primary conductive material to form vertical vias and plugs that enable electrical connections between different metal layers in multilevel interconnect structures, distinguished by its high thermal stability, low resistivity, and compatibility with chemical vapor deposition processes.

53

Publications

1.8K

Citations

240

Authors

61

Institutions

Publications per year

2017–2026

3

Authors

240

  1. BG
    B. Gorowitz

    General Electric (United States), United States

    4 publications · 50 citations

    4

    h-index

  2. RS
    R. Saia

    General Electric (United States), United States

    3 publications · 40 citations

    3

    h-index

  3. DW
    David W. Woodruff

    General Electric (United States), United States

    3 publications · 40 citations

    3

    h-index

  4. DB
    D.M. Brown

    General Electric (United States), United States

    3 publications · 40 citations

    3

    h-index

  5. CK
    Carter Kaanta

    IBM (United States), United States

    3 publications · 78 citations

    3

    h-index

1–5 of 240

Venues

  1. IEEE Electron Device Letters

    4 publications · 86 citations

    4

    h-index

  2. Journal of The Electrochemical Society

    JES · 3 publications · 109 citations

    3

    h-index

  3. Thin Solid Films

    3 publications · 66 citations

    3

    h-index

  4. Microelectronic Engineering

    3 publications · 97 citations

    3

    h-index

  5. Journal of Applied Physics

    2 publications · 62 citations

    2

    h-index

1–5