I. C. Noyan

Mechanisms for microstructure evolution in electroplated copper thin films near room temperature

J. M. E. Harper, C. Cabral, P. C. Andricacos et al. · Journal of Applied Physics · 1999 · 359 citations

Natural Sciences, Materials Engineering, Materials Science +17

Residual stress/strain analysis in thin films by X-ray diffraction

I. C. Noyan, Ting C. Huang, Brian York · Critical reviews in solid state and materials sciences/CRC critical reviews in solid state and materials sciences · 1995 · 247 citations

Natural Sciences, Materials Engineering, Materials Science +17

Phase transformation of thin sputter-deposited tungsten films at room temperature

S. M. Rossnagel, I. C. Noyan, C. Cabral · Journal of Vacuum Science & Technology B Microelectronics and Nanometer Structures Processing Measurement and Phenomena · 2002 · 172 citations

Natural Sciences, Materials Engineering, Materials Science +17

Microscale Laser Shock Peening of Thin Films, Part 1: Experiment, Modeling and Simulation

Wenwu Zhang, Y. Lawrence Yao, I. C. Noyan · Journal of Manufacturing Science and Engineering · 2004 · 155 citations

Natural Sciences, Materials Engineering, Materials Science +17

Electromigration-induced stress in aluminum conductor lines measured by x-ray microdiffraction

P.-C. Wang, G. S. Cargill, I. C. Noyan et al. · Applied Physics Letters · 1998 · 137 citations

Natural Sciences, Electrical Engineering, Materials Science +17