P.-C. Wang

Electromigration-induced stress in aluminum conductor lines measured by x-ray microdiffraction

P.-C. Wang, G. S. Cargill, I. C. Noyan et al. · Applied Physics Letters · 1998 · 137 citations

Engineering, Severe Plastic Deformation, Stress Gradient +19

X-Ray Microdiffraction for VLSI

P.-C. Wang, G. S. Cargill, I. C. Noyan et al. · MRS Proceedings · 1996 · 18 citations

X-ray Spectroscopy, Engineering, Physics +6

Strain Measurements and Laue Diffraction with Microbeams

P.-C. Wang, G. S. Cargill, I. C. Noyan · MRS Proceedings · 1994 · 15 citations

Engineering, Micromechanics, Strain Localization +5

Thermal and Electromigration Strain Distributions in 10 μm-Wide Aluminum Conductor Lines Measured by X-Ray Microdiffraction

P.-C. Wang, G. S. Cargill, I. C. Noyan et al. · MRS Proceedings · 1997 · 11 citations

Materials Science, Electromigration Technique, Engineering +7