Ting C. Huang - Concepedia

Author

Ting C. Huang

Also Known As

Huang, T.C. (IBM Research Div., San Jose, CA (United States). Almaden Research Center), T. C. Huang, T.C. Huang, TING C. HUANG, Tenglong Huang, Tianai Huang, Tianci Huang, Ting C. Huang

Publications

691

Citations

H-Index

Concepts

All Affiliations

IBM Research - Almaden IBM (United States)IBM Research - Thomas J. Watson Research Center

About

Ting C. Huang is an author at IBM Research - Almaden specializing in applied physics, engineering, and materials science.

Top Concepts

#	Concept	H-Index	Publications	Citations
1	Engineering	13	15	645
2	Natural Sciences	6	6	148
3	Health Sciences	2	2	39
4	Law	1	1	11
5	Administrative Law	1	1	11

Ting C. Huang

Publications

656

Citations

H-Index

Page 1

	Year	Citations
Residual stress/strain analysis in thin films by X-ray diffraction I. C. Noyan, Ting C. Huang, Brian York Critical reviews in solid state and materials sciences/CRC critical reviews in solid state and materials sciences EngineeringMechanical EngineeringResidual StressMechanics Of MaterialsStructural Materials	1995	241
X-ray depth profiling of iron oxide thin films Michael F. Toney, Ting C. Huang, S. Brennan, Journal of materials research/Pratt's guide to venture capital sources Materials ScienceX-ray Depth ProfilingX-ray SpectroscopyEngineeringCorrosion	1988	93
Surface and Ultra-Thin Film Characterization by Grazing-Incidence Asymmetric Bragg Diffraction Ting C. Huang Advances in X-ray Analysis Magnetic PropertiesEngineeringMagnetic MaterialsMagnetismOptical Properties	1989	43
Magnetic and magneto-optic properties of Bi-substituted garnet films crystallized by rapid thermal processing T. Suzuki, Federico Sequeda, Hoa Do, Journal of Applied Physics Ramp RateMagnetic PropertiesEngineeringCrystal Growth TechnologyMagnetic Materials	1990	39
Tl-Ca-Ba-Cu-O superconducting oxides R. Beyers, S. Parkin, V. Y. Lee, IBM Journal of Research and Development Materials ScienceMaterials EngineeringSuperconducting MaterialFuture WorkEngineering	1989	30
Quantitative X‐ray fluorescence analysis of thin films using LAMA‐2 Ting C. Huang X-Ray Spectrometry Materials ScienceMass ThicknessThin Film PhysicsX-ray SpectroscopyEngineering	1981	29
Characterization of Single- and Multiple-Layer Films by X-Ray Reflectometry Ting C. Huang, W. Parrish Advances in X-ray Analysis Optical MaterialsX-ray SpectroscopyEngineeringPolycapillary OpticsX-ray Imaging	1991	25
Circular stacking faults in silicon W. K. Tice, Ting C. Huang Applied Physics Letters Defect ToleranceFrank DislocationEngineeringDislocation InteractionPhysics	1974	24
Thin‐film characterization by x‐ray fluorescence Ting C. Huang X-Ray Spectrometry Materials ScienceThin Film PhysicsX-ray SpectroscopyEngineeringMultiple‐layer Thin Films	1991	24
Magnetic and structural properties of high rate dual ion-beam sputtered NiFe films (invited) Jerry Lo, C. Hwang, Ting C. Huang, Journal of Applied Physics Magnetic PropertiesEngineeringFilm Thermal StabilityThin Film Process TechnologyVacuum Device	1987	23

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