Ting C. Huang

Residual stress/strain analysis in thin films by X-ray diffraction

I. C. Noyan, Ting C. Huang, Brian York · Critical reviews in solid state and materials sciences/CRC critical reviews in solid state and materials sciences · 1995 · 247 citations

Natural Sciences, Materials Engineering, Materials Science +17

Surface and Ultra-Thin Film Characterization by Grazing-Incidence Asymmetric Bragg Diffraction

Ting C. Huang · Advances in X-ray Analysis · 1989 · 43 citations

Natural Sciences, Materials Engineering, Materials Science +17

Tl-Ca-Ba-Cu-O superconducting oxides

R. Beyers, S. Parkin, V. Y. Lee et al. · IBM Journal of Research and Development · 1989 · 30 citations

Natural Sciences, Materials Science, Physics +13

Quantitative X‐ray fluorescence analysis of thin films using LAMA‐2

Ting C. Huang · X-Ray Spectrometry · 1981 · 29 citations

Natural Sciences, Materials Engineering, Materials Science +17

Characterization of Single- and Multiple-Layer Films by X-Ray Reflectometry

Ting C. Huang, W. Parrish · Advances in X-ray Analysis · 1991 · 25 citations

Natural Sciences, Materials Engineering, Materials Science +14