Fluctuation limits & amp; scaling opportunities for CMOS SRAM cells

A.J. Bhavnagarwala, Stephen Kosonocky, C. Radens, +4

Non-volatile MemoryElectrical EngineeringEngineeringVlsi DesignRetention Dc Margins +11

SRAM cell design for stability methodology

C. Wann, Robert Wong, David Frank, +9

Hardware SecurityNon-volatile MemoryElectrical EngineeringEngineeringSram Stability +9

Reduction of the C54–TiSi2 phase transformation temperature using refractory metal ion implantation

R. Mann, G. L. Miles, Thomas A. Knotts, +5

Applied Physics Letters

Materials ScienceIon ImplantationEngineeringCrystalline DefectsW Implantation +4

Silicides and local interconnections for high-performance VLSI applications

R. Mann, L. A. Clevenger, P. Agnello, +1

IBM Journal of Research and Development

Electrical EngineeringElectronic DevicesEngineeringVlsi DesignLocal Interconnections +10

Lateral ion implant straggle and mask proximity effect

Terence B. Hook, J. Brown, P.E. Cottrell, +4

IEEE Transactions on Electron Devices

Device ModelingMask Proximity EffectElectrical EngineeringIon ImplantationEngineering +12

High performance and low power transistors integrated in 65nm bulk CMOS technology

Zuying Luo, An Steegen, M. Eller, +38

Low-power ElectronicsLow Power ApplicationsElectrical EngineeringEngineeringVlsi Design +10

Low temperature formation of C54–TiSi2 using titanium alloys

C. Cabral, L. A. Clevenger, J. M. E. Harper, +7

Applied Physics Letters

Materials EngineeringMaterials ScienceHigh Temperature MaterialsEngineeringCrystalline Defects +12

Kinetic analysis of C49-TiSi2 and C54-TiSi2 formation at rapid thermal annealing rates

L. A. Clevenger, J. M. E. Harper, C. Cabral, +3

Journal of Applied Physics

C54-tisi2 FormationEngineeringThin Film Process TechnologyChemistrySilicon On Insulator +17

The C49 to C54 Phase Transformation in TiSi2 Thin Films

R. Mann, L. A. Clevenger

Journal of The Electrochemical Society

EngineeringChemistryPolymorphic Phase TransformationTisi2 Thin FilmsSilicene +16

Enchanced multi-threshold (MTCMOS) circuits using variable well bias

Stephen Kosonocky, M. Immediato, P.E. Cottrell, +3

Low-power ElectronicsElectrical EngineeringBias AuthorsEngineeringVlsi Design +8