P.E. Cottrell

Finite-Element Analysis of Semiconductor Devices: The FIELDAY Program

E. M. Buturla, P.E. Cottrell, B.M. Grossman et al. · IBM Journal of Research and Development · 1981 · 305 citations

Numerical Analysis, Engineering, Field-effect Transistors +20

Hot-electron emission in N-channel IGFET's

P.E. Cottrell, R.R. Troutman, T.H. Ning · IEEE Transactions on Electron Devices · 1979 · 181 citations

Igfet Structures, Electrical Engineering, Channel Hot Electrons +14

Metal-gate FinFET and fully-depleted SOI devices using total gate silicidation

J. Kedzierski, E. Nowak, T. Kanarsky et al. · 2003 · 171 citations

Electrical Engineering, Engineering, Total Gate Silicidation +9

Device and Technology Evolution for Si-Based RF Integrated Circuits

Herbert S. Bennett, Ralf Brederlow, Júlio Costa et al. · IEEE Transactions on Electron Devices · 2005 · 124 citations

Device Feature Size, Electrical Engineering, Engineering +15

Lateral ion implant straggle and mask proximity effect

Terence B. Hook, J. Brown, P.E. Cottrell et al. · IEEE Transactions on Electron Devices · 2003 · 99 citations

Device Modeling, Mask Proximity Effect, Electrical Engineering +14