Surface State Density Reduction

Surface State Density Reduction is a surface passivation technique that specifically targets the minimization of electronic trap states at semiconductor interfaces through chemical or physical modification of the surface composition and structure.

111

Publications

6.5K

Citations

412

Authors

142

Institutions

Publications per year

2017–2026

15

Authors

412

  1. CL
    Ching-Ting Lee

    National Cheng Kung University, Taiwan

    3 publications · 120 citations

    3

    h-index

  2. YN
    Yasuo Nannichi

    University of Tsukuba, Japan

    3 publications · 419 citations

    3

    h-index

  3. FH
    Fred H. Pollak

    Brooklyn College, United States

    3 publications · 68 citations

    3

    h-index

  4. JF
    Jia-Fa Fan

    University of Tsukuba, Japan

    3 publications · 419 citations

    3

    h-index

  5. TK
    Takeshi Kobayashi

    The University of Osaka, Japan

    3 publications · 67 citations

    3

    h-index

1–5 of 412

Venues

  1. Applied Physics Letters

    16 publications · 806 citations

    15

    h-index

  2. Journal of Applied Physics

    12 publications · 315 citations

    11

    h-index

  3. Japanese Journal of Applied Physics

    JJAP · 10 publications · 615 citations

    10

    h-index

  4. Surface Science

    5 publications · 194 citations

    5

    h-index

  5. IEEE Transactions on Electron Devices

    5 publications · 180 citations

    5

    h-index

1–5