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An investigation of surface states at a silicon/silicon oxide interface employing metal-oxide-silicon diodes

1.4K

Citations

10

References

1962

Year

References

YearCitations

1939

1.2K

1955

555

1959

257

1956

93

1956

77

1957

36

1960

34

1957

32

1961

30

1959

25

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