Fred H. Pollak

Stress-Induced Shifts of First-Order Raman Frequencies of Diamond- and Zinc-Blende-Type Semiconductors

F. Cerdeira, C.J. Buchenauer, Fred H. Pollak et al. · Physical review. B, Solid state · 1972 · 891 citations

Optical Materials, Engineering, Spectroscopic Property +19

Piezo-Electroreflectance in Ge, GaAs, and Si

Fred H. Pollak, M. Cardona · Physical Review · 1968 · 850 citations

Semiconductors, Shear Deformation Potentials, Nonlinear Stress Dependence +11

Electroreflectance at a Semiconductor-Electrolyte Interface

M. Cardona, K. L. Shaklee, Fred H. Pollak · Physical Review · 1967 · 778 citations

Engineering, Semiconductor-electrolyte Interface, Electronic Structure +19

Energy-Band Structure of Germanium and Silicon: The k·p Method

M. Cardona, Fred H. Pollak · Physical Review · 1966 · 640 citations

Wave Vector, Engineering, Energy Bands +16

Effect of static uniaxial stress on the Raman spectrum of silicon

E. Anastassakis, A. Pinczuk, E. Burstein et al. · Solid State Communications · 1970 · 597 citations

Materials Science, Engineering, Optical Properties +7