Pattern Defect Reduction

Pattern Defect Reduction is a methodological framework in thin-film patterning that systematically minimizes deviations from intended pattern geometries by identifying, analyzing, and mitigating sources of defects during fabrication processes.

63

Publications

1.9K

Citations

390

Authors

88

Institutions

Publications per year

2017–2026

6

Authors

390

  1. MS
    Mark Somervell

    IMEC, Belgium

    4 publications · 110 citations

    4

    h-index

  2. SV
    S. V. Sreenivasan

    The University of Texas at Austin, United States

    3 publications · 71 citations

    3

    h-index

  3. JB
    Joost Bekaert

    IMEC, Belgium

    3 publications · 84 citations

    3

    h-index

  4. RG
    Roel Gronheid

    IMEC, Belgium

    3 publications · 83 citations

    3

    h-index

  5. HZ
    Hongbo Zhang

    University of Illinois Urbana-Champaign, United States

    3 publications · 54 citations

    3

    h-index

1–5 of 390

Venues

  1. 14

    h-index

  2. Journal of Crystal Growth

    7 publications · 248 citations

    7

    h-index

  3. Japanese Journal of Applied Physics

    JJAP · 3 publications · 91 citations

    3

    h-index

  4. 2

    h-index

  5. Annals of Plastic Surgery

    1 publications · 49 citations

    1

    h-index

1–5