Drop Testing

Drop Testing is a mechanical integrity assessment method used in nuclear engineering to evaluate the structural resilience and safety performance of dry cask storage systems under simulated accidental drop conditions, distinguishing it from other testing methods by its focus on impact-induced failure modes during handling and transportation.

285

Publications

9.5K

Citations

825

Authors

269

Institutions

Publications per year

2017–2026

35

Authors

825

  1. CT
    Chwee Teck Lim

    National University of Singapore, Singapore

    16 publications · 1.1K citations

    15

    h-index

  2. EW
    E.H. Wong

    Institute of Microelectronics, Singapore

    14 publications · 603 citations

    14

    h-index

  3. CY
    Chang-Lin Yeh

    Advanced Semiconductor Engineering (Taiwan), Taiwan

    15 publications · 610 citations

    14

    h-index

  4. TY
    Tong Yan Tee

    STMicroelectronics (Singapore), Singapore

    16 publications · 1K citations

    14

    h-index

  5. YL
    Yi‐Shao Lai

    Advanced Semiconductor Engineering (Taiwan), Taiwan

    12 publications · 517 citations

    12

    h-index

1–5 of 825

Venues

  1. Microelectronics Reliability

    18 publications · 1K citations

    16

    h-index

  2. 8

    h-index

  3. 6

    h-index

  4. Journal of Electronic Materials

    JEM · 5 publications · 93 citations

    5

    h-index

  5. 5

    h-index

1–5