Shreesh Narasimha

Record RF performance of 45-nm SOI CMOS Technology

Sungjae Lee, B. Jagannathan, Shreesh Narasimha et al. · 2007 · 179 citations

Engineering, Electrical Engineering, Microelectronics +16

Challenges of nickel silicidation in CMOS technologies

N. Breil, C. Lavoie, Ahmet S. Özcan et al. · Microelectronic Engineering · 2014 · 54 citations

Engineering, Electrical Engineering, Materials Science +8

New breakdown data generation and analytics methodology to address BEOL and mol dielectric TDDB process development and technology qualification challenges

Fen Chen, Carole Graas, M. Shinosky et al. · 2014 · 35 citations

Engineering, Electrical Engineering, Materials Engineering +17

Breakdown data generation and in-die deconvolution methodology to address BEOL and MOL dielectric breakdown challenges

F. Chen, Carole Graas, M. Shinosky et al. · Microelectronics Reliability · 2015 · 18 citations

Engineering, Electrical Engineering, Materials Engineering +12

Impact of Lateral Asymmetric Channel Doping on 45-nm-Technology N-Type SOI MOSFETs

Hasan M. Nayfeh, N. Rovedo, A. Bryant et al. · IEEE Transactions on Electron Devices · 2009 · 15 citations

Engineering, Computer Engineering, Electrical Engineering +17