Carole Graas

New breakdown data generation and analytics methodology to address BEOL and mol dielectric TDDB process development and technology qualification challenges

Fen Chen, Carole Graas, M. Shinosky et al. · 2014 · 33 citations

Engineering, Education, Careful Data Deconvolution +20

Electromigration reliability improvement of W-plug vias by titanium layering

Carole Graas, Huy Le, J. W. McPherson et al. · 1994 · 22 citations

Engineering, Refractory Barrier, Interconnect (Integrated Circuits) +16

Breakdown data generation and in-die deconvolution methodology to address BEOL and MOL dielectric breakdown challenges

F. Chen, Carole Graas, M. Shinosky et al. · Microelectronics Reliability · 2015 · 18 citations

Breakdown Data Generation, Electrical Engineering, Engineering +7

Impact of test structure design on electromigration lifetime measurements

Larry Ting, Carole Graas · 1995 · 13 citations

Engineering, Measurement, Education +17

Reliability challenges for deep submicron interconnects

J. W. McPherson, Huy Le, Carole Graas · Microelectronics Reliability · 1997 · 12 citations

Reliability, Electrical Engineering, Reliability Engineering +6