Carole Graas

New breakdown data generation and analytics methodology to address BEOL and mol dielectric TDDB process development and technology qualification challenges

Fen Chen, Carole Graas, M. Shinosky et al. · 2014 · 35 citations

Engineering, Electrical Engineering, Materials Engineering +17

Electromigration reliability improvement of W-plug vias by titanium layering

Carole Graas, Huy Le, J. W. McPherson et al. · 1994 · 22 citations

Engineering, Electrical Engineering, Materials Engineering +16

Breakdown data generation and in-die deconvolution methodology to address BEOL and MOL dielectric breakdown challenges

F. Chen, Carole Graas, M. Shinosky et al. · Microelectronics Reliability · 2015 · 18 citations

Engineering, Electrical Engineering, Materials Engineering +12

Impact of test structure design on electromigration lifetime measurements

Larry Ting, Carole Graas · 1995 · 13 citations

Engineering, Electrical Engineering, Materials Science +16

Reliability challenges for deep submicron interconnects

J. W. McPherson, Huy Le, Carole Graas · Microelectronics Reliability · 1997 · 12 citations

Engineering, Computer Engineering, Electrical Engineering +14