Concepedia

F. Chen

FC

18

Publications

673

Citations

16

H-Index

2004

Active since

Affiliations

IBM (United States)(Current)

IBM Research - Thomas J. Watson Research Center

Toshiba (United States)

Advanced Micro Devices (United States)

Advanced Micro Devices (Canada)

F. Chen is an author at IBM (United States) specializing in microelectronics, electrical engineering, and engineering.

Top concepts

EngineeringMicroelectronicsElectrical EngineeringElectronic PackagingApplied PhysicsNanoelectronicsMaterials EngineeringComputer EngineeringElectrical InsulationMaterial Science

Publications per year

2004–2015

18

Publications

18

A Comprehensive Study of Low-k SiCOH TDDB Phenomena and Its Reliability Lifetime Model Development

F. Chen, Kaushik Chanda, P. McLaughlin et al. · 2006 · 161 citations

Engineering, Comprehensive Study, Reliability Engineering +17

3D copper TSV integration, testing and reliability

Mukta Farooq, Troy Graves-Abe, W. Landers et al. · 2011 · 106 citations

3D Ic Architecture, Electrical Engineering, Engineering +15

Cu/low-k dielectric TDDB reliability issues for advanced CMOS technologies

F. Chen, D. Harmon, M. Shinosky et al. · Microelectronics Reliability · 2008 · 48 citations

Electrical Engineering, Engineering, Hardware Reliability +7

Line edge roughness and spacing effect on low-k TDDB characteristics

F. Chen, J. R. Lloyd, Kaushik Chanda et al. · 2008 · 46 citations

Electrical Engineering, Engineering, Hardware Reliability +9

Investigation of CVD SiCOH low-k time-dependent dielectric breakdown at 65nm node technology

F. Chen, Kaushik Chanda, Inderbir S. Gill et al. · 2005 · 42 citations

Materials Science, Tddb Degradation, Electrical Engineering +14

Rows per page

1–5 of 18