Hasan M. Nayfeh

Evidence for the utility of quantum computing before fault tolerance

Young‐Seok Kim, Andrew Eddins, Sajant Anand et al. · Nature · 2023 · 1K citations · Full text

Computing, Computer Science, Physics +16

Strained silicon MOSFET technology

Judy L. Hoyt, Hasan M. Nayfeh, S. Eguchi et al. · 2003 · 248 citations

Engineering, Electrical Engineering, Materials Science +17

High performance 14nm SOI FinFET CMOS technology with 0.0174µm ² embedded DRAM and 15 levels of Cu metallization

C-H. Lin, B. Greene, J. Cai et al. · 2014 · 129 citations

Engineering, Computer Engineering, Electrical Engineering +9

High Performance 45-nm SOI Technology with Enhanced Strain, Porous Low-k BEOL, and Immersion Lithography

P. Agnello, T. Ivers, C. Warm et al. · 2006 · 115 citations

Engineering, Computer Engineering, Electrical Engineering +17

A Physically Based Analytical Model for the Threshold Voltage of Strained-Si n-MOSFETs

Hasan M. Nayfeh, Judy L. Hoyt, D.A. Antoniadis · IEEE Transactions on Electron Devices · 2004 · 80 citations

Engineering, Electrical Engineering, Materials Science +17