C. D’Emic

Ultrathin high-K metal oxides on silicon: processing, characterization and integration issues

E. P. Gusev, E. Cartier, D. A. Buchanan et al. · Microelectronic Engineering · 2001 · 386 citations

Natural Sciences, Materials Engineering, Materials Science +12

Performance dependence of CMOS on silicon substrate orientation for ultrathin oxynitride and HfO₂ gate dielectrics

Min Yang, E. P. Gusev, M. Ieong et al. · IEEE Electron Device Letters · 2003 · 166 citations

Engineering, Electrical Engineering, Materials Science +17

SiGe-on-insulator prepared by wafer bonding and layer transfer for high-performance field-effect transistors

Lida Huang, J. O. Chu, D. Canaperi et al. · Applied Physics Letters · 2001 · 111 citations

Engineering, Materials Engineering, Materials Science +17

Microstructure and thermal stability of HfO2 gate dielectric deposited on Ge(100)

E. P. Gusev, Huiling Shang, M. Copel et al. · Applied Physics Letters · 2004 · 96 citations

Engineering, Materials Engineering, Materials Science +17

Silicon Nanowire Field Effect Transistor Sensors with Minimal Sensor-to-Sensor Variations and Enhanced Sensing Characteristics

Sufi Zafar, C. D’Emic, Ashish V. Jagtiani et al. · ACS Nano · 2018 · 96 citations

Engineering, Bioengineering, Electrical Engineering +15