Nicolas Daval

High immunity to threshold voltage variability in undoped ultra-thin FDSOI MOSFETs and its physical understanding

O. Weber, O. Faynot, F. Andrieu et al. · 2008 · 159 citations

Engineering, Electrical Engineering, Materials Science +17

Engineering strained silicon on insulator wafers with the Smart CutTM technology

B. Ghyselen, Jean‐Michel Hartmann, T. Ernst et al. · Solid-State Electronics · 2004 · 117 citations

Engineering, Materials Engineering, Materials Science +14

Monolithic integration of InP-based transistors on Si substrates using MBE

W.K. Liu, D. Lubyshev, J. M. Fastenau et al. · Journal of Crystal Growth · 2008 · 61 citations

Engineering, Electrical Engineering, Electronic Materials +11

Strained FDSOI CMOS technology scalability down to 2.5nm film thickness and 18nm gate length with a TiN/HfO<inf>2</inf> gate stack

V. Barral, T. Poiroux, F. Andrieu et al. · 2007 · 47 citations

Engineering, Electrical Engineering, Materials Science +17

Comparative Simulation Analysis of Process-Induced Variability in Nanoscale SOI and Bulk Trigate FinFETs

A. R. Brown, Nicolas Daval, K.K. Bourdelle et al. · IEEE Transactions on Electron Devices · 2013 · 41 citations

Engineering, Electrical Engineering, Microelectronics +16