Statistics
Publications
7
Citations
165
H-Index
7
Active since
2013
Catharina Rudolph is an author at Fraunhofer Institute for Reliability and Microintegration specializing in materials science, engineering, and applied physics.
Publications per year
2013–2024
7
7
Low Temperature Cu Interconnect with Chip to Wafer Hybrid Bonding
Guilian Gao, Laura Mirkarimi, Thomas Workman et al. · 2019 · 62 citations
Microstructure Development of Cu/SiO₂ Hybrid Bond Interconnects After Reliability Tests
Iuliana Panchenko, Laura Wenzel, Maik Mueller et al. · IEEE Transactions on Components Packaging and Manufacturing Technology · 2022 · 20 citations · Full text
Engineering, Integrated Circuits, Interconnect (Integrated Circuits) +16
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