Statistics
Publications
6
Citations
152
H-Index
6
Active since
2019
Anke Hanisch is an author at Fraunhofer Institute for Reliability and Microintegration specializing in semiconductor devices, interconnect technology, and materials science.
Publications per year
2019–2023
6
6
Low Temperature Cu Interconnect with Chip to Wafer Hybrid Bonding
Guilian Gao, Laura Mirkarimi, Thomas Workman et al. · 2019 · 63 citations
Process and Design Challenges for Hybrid Bonding
Vikas Dubey, Dirk Wünsch, Knut Gottfried et al. · ECS Transactions · 2023 · 17 citations · Full text
Engineering, Electrical Engineering, Materials Engineering +16
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