Built-in self test of S2I switched current circuits

Physical Versus Logical Fault Models MOS LSI Circuits: Impact on Their Testability

Galiay, Crouzet, Vergniault · IEEE Transactions on Computers · 1980 · 362 citations

Engineering, Computer Engineering, Electrical Engineering +14

S ² I: a switched-current technique for high performance

J.B. Hughes, K.W. Moulding · Electronics Letters · 1993 · 145 citations

Engineering, Computer Engineering, Electrical Engineering +15

Electrical Characteristics and Testing Considerations for Gate Oxide Shorts in CMOS ICs.

C.F. Hawkins, J.M. Soden · International Test Conference · 1985 · 135 citations

Engineering, Computer Engineering, Electrical Engineering +17

Reliability and electrical properties of gate oxide shorts in CMOS ICs

J.M. Soden, C.F. Hawkins · International Test Conference · 1986 · 134 citations

Engineering, Computer Engineering, Electrical Engineering +17

Built-in self-test (BIST) structure for analog circuit fault diagnosis

C.-L. Wey · IEEE Transactions on Instrumentation and Measurement · 1990 · 121 citations

Engineering, Electrical Engineering, Analog Electronics +13