C.-L. Wey

Built-in self-test (BIST) structure for analog circuit fault diagnosis

C.-L. Wey · IEEE Transactions on Instrumentation and Measurement · 1990 · 121 citations

Engineering, Measurement, Diagnosis +17

Built-in self-test (BIST) structures for analog circuit fault diagnosis with current test data

C.-L. Wey, S. Krishman · IEEE Transactions on Instrumentation and Measurement · 1992 · 47 citations

Bist Structure, Fault Diagnosis, Electrical Engineering +15

On yield consideration for the design of redundant programmable logic arrays

C.-L. Wey · IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems · 1988 · 33 citations

Yield Consideration, Engineering, Vlsi Design +20

The design of concurrent error diagnosable systolic arrays for band matrix multiplications

S.-W. Chan, C.-L. Wey · IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems · 1988 · 32 citations

Array Computing, Engineering, Vlsi Design +15

On the implementation of an analog ATPG: the nonlinear case

C.-L. Wey, R. Saeks · IEEE Transactions on Instrumentation and Measurement · 1988 · 24 citations

Electrical Engineering, Engineering, Analog-to-digital Converter +15