Self-test Architecture

Self-Test Architecture is a structural framework within built-in self-test systems that integrates self-diagnostic mechanisms, test pattern generation, and response analysis components to enable autonomous fault detection and verification of circuit functionality without external test equipment.

604

Publications

19.4K

Citations

1.4K

Authors

404

Institutions

Publications per year

2017–2026

Variants

Bist ArchitectureBuilt-in Self-test Architecture

Parents

Built-in Self-test

Publications

604

Self-Testing of Multichip Logic Modules.

Paul H. Bardell, W.H. McAnney · International Test Conference · 1982 · 270 citations

Engineering, Computer Engineering, Computer Science +12

A tutorial on built-in self-test. I. Principles

Vishwani D. Agrawal, C.R. Kime, Kewal K. Saluja · IEEE Design & Test of Computers · 1993 · 269 citations

Engineering, Computer Engineering, Computer Science +12

A structured test re-use methodology for core-based system chips

P. Varma, B. Bhatia · 2002 · 260 citations

Engineering, Computer Engineering, Computer Systems +17

Microprocessor Software-Based Self-Testing

Mihalis Psarakis, Dimitris Gizopoulos, Ernesto Sánchez et al. · IEEE Design & Test of Computers · 2010 · 256 citations

Engineering, Computer Engineering, Computer Science +15

Secure Scan: A Design-for-Test Architecture for Crypto Chips

Bo Yang, Kaijie Wu, Ramesh Karri · IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems · 2006 · 239 citations

Computing, Computer Engineering, Computer Science +16

1–5 of 604

Authors

1.4K

CE
Charles E. Stroud
University of Kentucky, United States
20 publications · 1.1K citations
15
h-index
AP
A. Paschalis
National and Kapodistrian University of Athens, Greece
16 publications · 503 citations
14
h-index
YZ
Y. Zorian
Cirrus Logic (United States), United States
16 publications · 616 citations
14
h-index
DG
Dimitris Gizopoulos
National and Kapodistrian University of Athens, Greece
15 publications · 694 citations
14
h-index
MS
M. Sonza Reorda
Politecnico di Torino, Italy
13 publications · 555 citations
12
h-index

1–5 of 1.4K

Institutions

404

1–8 of 404

Venues

IEEE Design & Test of Computers
30 publications · 1.9K citations
20
h-index
IEEE Transactions on Computers
26 publications · 1.5K citations
19
h-index
IEEE Transactions on Very Large Scale Integration (VLSI) Systems
19 publications · 735 citations
16
h-index
IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems
21 publications · 1K citations
16
h-index
IEEE Transactions on Instrumentation and Measurement
18 publications · 571 citations
14
h-index

1–5