IEEE Transactions on Electron Devices · 2021 · 17 citations · 17 references
EngineeringElectrical EngineeringMaterials ScienceMicroelectronicsSemiconductor DevicesSemiconductor MaterialsCarrier TransportDevice ModelingSemiconductor HeterostructuresSemiconductor PhysicsWide Band Gap SemiconductorsWide-bandgap SemiconductorsElectron MobilityEnergy Band GapHeterostructure Device ModelingHeterostructuresHigh-electron-mobility TransistorsNumerical Solution Of The Schrödinger EquationSchrödinger-poisson SystemTransconductance
Multiple-channel GaN heterostructures have been used to improve the device performance of high electron mobility transistors (HEMTs). The object is to achieve highly linear transconductance, low ON-resistance, and large output current. However, the complicated situation of the multiple channels made it difficult to model multiple-channel HEMTs. We report an analytical model of the electron population and the energy band diagram of multiple-channel GaN heterostructures. It is established based on the continuity of electric displacement vector at various interfaces and the electric neutrality of the whole heterostructure. The double-channel, triple-channel, four-channel, and ten-channel heterostructures have been investigated, and the calculation results are compared with the numerical self-consistent Schrödinger-Poisson solution to show the feasibility of the model.
17
Negative Field-Effect Mobility on (100) Si Surfaces
F. F. Fang, W. E. Howard · Physical Review Letters · 1966 · 525 citations
The toughest transistor yet [GaN transistors]
L.F. Eastman, Umesh K. Mishra · IEEE Spectrum · 2002 · 231 citations
AlGaN-GaN Double-Channel HEMTs
Rongming Chu, Yugang Zhou, Jie Liu et al. · IEEE Transactions on Electron Devices · 2005 · 146 citations