AEU - International Journal of Electronics and Communications · 2019 · 29 citations · 23 references
EngineeringElectrical EngineeringMaterials ScienceElectronic MaterialsMicroelectronicsSemiconductor DevicesComplementary Metal-oxide-semiconductor TechnologyDielectricsQuantum TunnelingShort-channel EffectsTunnelingCarrier Tunneling Across InterfacesInterface Trap DensityInterface Trap ModelingInterface Trap ReductionInterface Trap StatesQuantum Tunneling EffectsTunneling Barriers
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Tunnel field-effect transistor without gate-drain overlap
Anne S. Verhulst, William G. Vandenberghe, Karen Maex et al. · Applied Physics Letters · 2007 · 432 citations · Full text