Microelectronics Reliability · 2019 · 23 citations · 35 references
EngineeringElectrical EngineeringElectronic MaterialsMicroelectronicsSemiconductor DevicesComplementary Metal-oxide-semiconductor TechnologyDevice CharacterizationField-effect TransistorsMetal-oxide-semiconductor Field-effect TransistorsField-effect Transistor Transfer CharacteristicsGate-dependent Current-voltage BehaviorInterface Trap ReductionInterface TrapsTraps
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Tunnel field-effect transistor without gate-drain overlap
Anne S. Verhulst, William G. Vandenberghe, Karen Maex et al. · Applied Physics Letters · 2007 · 432 citations · Full text