A low voltage SANOS nonvolatile semiconductor memory (NVSM) device

High-κ gate dielectrics: Current status and materials properties considerations

G. D. Wilk, Robert M. Wallace, J. Anthony · Journal of Applied Physics · 2001 · 5.9K citations

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On the go with SONOS

Michael White, Dennis A. Adams, Jianhui Bu · IEEE Circuits and Devices Magazine · 2000 · 399 citations

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Ultrathin HfO2 films grown on silicon by atomic layer deposition for advanced gate dielectrics applications

E. P. Gusev, C. Cabral, M. Copel et al. · Microelectronic Engineering · 2003 · 309 citations

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Charge-trapping device structure of SiO2∕SiN∕high-k dielectric Al2O3 for high-density flash memory

Chang‐Hyun Lee, Sung‐Hoi Hur, You-Cheol Shin et al. · Applied Physics Letters · 2005 · 218 citations

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Charge retention of scaled SONOS nonvolatile memory devices at elevated temperatures

Yang Yang, Marvin H. White · Solid-State Electronics · 2000 · 207 citations

Engineering, Computer Engineering, Electrical Engineering +16