Sung‐Hoi Hur

Effects of floating-gate interference on NAND flash memory cell operation

Sung‐Hoi Hur, Jungdal Choi · IEEE Electron Device Letters · 2002 · 496 citations

Engineering, Computer Engineering, Electrical Engineering +10

Charge-trapping device structure of SiO2∕SiN∕high-k dielectric Al2O3 for high-density flash memory

Chang‐Hyun Lee, Sung‐Hoi Hur, You-Cheol Shin et al. · Applied Physics Letters · 2005 · 218 citations

Engineering, Materials Engineering, Materials Science +17

A physical-based analytical turn-on model of polysilicon thin-film transistors for circuit simulation

Gi-Yong Yang, Sung‐Hoi Hur, Chul‐Hi Han · IEEE Transactions on Electron Devices · 1999 · 62 citations

Engineering, Electrical Engineering, Materials Science +17

8Gb MLC (Multi-Level Cell) NAND flash memory using 63nm process technology

Jong‐Ho Park, Sung‐Hoi Hur, Joun-Hee Lee et al. · 2005 · 53 citations

Engineering, Computer Engineering, Electrical Engineering +13

The new program/erase cycling degradation mechanism of NAND flash memory devices

Albert Fayrushin, Kwang-Soo Seol, J.H. Na et al. · 2009 · 36 citations

Engineering, Computer Engineering, Electrical Engineering +16