Concepedia

Characterization of Microdose Damage Caused by Single Heavy Ion Observed in Trench Type Power MOSFETs

S. Kuboyama, Akifumu Maru, Naomi Ikeda, Toshio Hirao, Takashi Tamura

IEEE Transactions on Nuclear Science · 2010 · 25 citations · 6 references

DOI

Concepts

Abstract

It was demonstrated that anomalously large degradation observed in power MOSFETs was caused by a single heavy ion. It was identified as a microdose effect and successfully characterized by several parameters extracted from the experimental data.

References

6

Enhanced Degradation in Power MOSFET Devices Due to Heavy Ion Irradiation

James A. Felix, M.R. Shaneyfelt, James R. Schwank et al. · IEEE Transactions on Nuclear Science · 2007 · 74 citations

, , +16

Angular Dependence of Single Event Sensitivity in Hardened Flip/Flop Designs

M.P. Baze, B.W. Hughlock, J.L. Wert et al. · IEEE Transactions on Nuclear Science · 2008 · 54 citations

, , +6

An analytic representation of the radial distribution of dose from energetic heavy ions in water, Si, LiF, NaI, and SiO<sub>2</sub>

Robert Katz, Kim Sun Loh, Luo Daling · Radiation effects and defects in solids · 1990 · 52 citations

, , +14

Enhanced Proton and Neutron Induced Degradation and Its Impact on Hardness Assurance Testing

M.R. Shaneyfelt, James A. Felix, P.E. Dodd et al. · IEEE Transactions on Nuclear Science · 2008 · 25 citations

, , +15

DICE-Based Flip-Flop With SET Pulse Discriminator on a 90 nm Bulk CMOS Process

Akifumi Maru, H. Shindou, T. Ebihara et al. · IEEE Transactions on Nuclear Science · 2010 · 19 citations

, , +16