Toshio Hirao

Single-Event Damages Caused by Heavy Ions Observed in AlGaN/GaN HEMTs

S. Kuboyama, Akifumi Maru, H. Shindou et al. · IEEE Transactions on Nuclear Science · 2011 · 106 citations

Wide-bandgap Semiconductor, Electrical Engineering, Engineering +12

Anomalous Charge Collection in Silicon Carbide Schottky Barrier Diodes and Resulting Permanent Damage and Single-Event Burnout

S. Kuboyama, Chihiro Kamezawa, Naomi Ikeda et al. · IEEE Transactions on Nuclear Science · 2006 · 101 citations

Semiconductor Technology, Electrical Engineering, Engineering +12

Single-Event Burnout of Silicon Carbide Schottky Barrier Diodes Caused by High Energy Protons

S. Kuboyama, Chihiro Kamezawa, Yohei Satoh et al. · IEEE Transactions on Nuclear Science · 2007 · 68 citations

Semiconductor Technology, Electrical Engineering, Engineering +10

High-injection carrier dynamics generated by MeV heavy ions impacting high-speed photodetectors

Jamie S. Laird, Toshio Hirao, Shinobu Onoda et al. · Journal of Applied Physics · 2005 · 44 citations

Local Electric Field, Electrical Engineering, High-speed Photodetectors +15

LET Dependence of Single Event Transient Pulse-Widths in SOI Logic Cell

Takahiro Makino, Daisuke Kobayashi, Kazuyuki Hirose et al. · IEEE Transactions on Nuclear Science · 2009 · 39 citations

Electrical Engineering, Engineering, Pulse Capture Circuits +9