Naomi Ikeda

Single-Event Damages Caused by Heavy Ions Observed in AlGaN/GaN HEMTs

S. Kuboyama, Akifumi Maru, H. Shindou et al. · IEEE Transactions on Nuclear Science · 2011 · 112 citations

Engineering, Electrical Engineering, Materials Science +17

Anomalous Charge Collection in Silicon Carbide Schottky Barrier Diodes and Resulting Permanent Damage and Single-Event Burnout

S. Kuboyama, Chihiro Kamezawa, Naomi Ikeda et al. · IEEE Transactions on Nuclear Science · 2006 · 103 citations · Full text

Engineering, Electrical Engineering, Materials Science +17

<title>Submillimeter limb-emission sounder JEM/SMILES aboard the Space Station</title>

Junji Inatani, Hiroyuki Ozeki, Ryouta Satoh et al. · Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE · 2000 · 31 citations

Natural Sciences, Aerospace Engineering, Electrical Engineering +13

Study of Latent Damage in Power MOSFETs Caused by Heavy Ion Irradiation

Naomi Ikeda, S. Kuboyama, Yohei Satoh et al. · IEEE Transactions on Nuclear Science · 2008 · 28 citations · Full text

Engineering, Electrical Engineering, Radiation Physics +16

Characterization of Microdose Damage Caused by Single Heavy Ion Observed in Trench Type Power MOSFETs

S. Kuboyama, Akifumu Maru, Naomi Ikeda et al. · IEEE Transactions on Nuclear Science · 2010 · 25 citations

Engineering, Electrical Engineering, Microelectronics +16