James A. Felix

Radiation Effects in MOS Oxides

James R. Schwank, M.R. Shaneyfelt, Daniel M. Fleetwood et al. · IEEE Transactions on Nuclear Science · 2008 · 935 citations

Engineering, Electrical Engineering, Materials Science +17

Enhanced Degradation in Power MOSFET Devices Due to Heavy Ion Irradiation

James A. Felix, M.R. Shaneyfelt, James R. Schwank et al. · IEEE Transactions on Nuclear Science · 2007 · 74 citations

Engineering, Electrical Engineering, Microelectronics +16

Total Ionizing Dose and Single Event Effects Hardness Assurance Qualification Issues for Microelectronics

M.R. Shaneyfelt, James R. Schwank, P.E. Dodd et al. · IEEE Transactions on Nuclear Science · 2008 · 42 citations

Engineering, Electrical Engineering, Microelectronics +12

Radiation-induced charge trapping in thin Al2O3/SiOxNy/Si(100) gate dielectric stacks.

C. D'Emic, E. P. Gusev, Ronald D. Schrimpf et al. · OSTI OAI (U.S. Department of Energy Office of Scientific and Technical Information) · 2003 · 28 citations

Engineering, Electrical Engineering, Materials Science +17

Enhanced Proton and Neutron Induced Degradation and Its Impact on Hardness Assurance Testing

M.R. Shaneyfelt, James A. Felix, P.E. Dodd et al. · IEEE Transactions on Nuclear Science · 2008 · 25 citations

Engineering, Electrical Engineering, Physics +15