J.L. Wert

HBD layout isolation techniques for multiple node charge collection mitigation

Jeffrey D. Black, Andrew L. Sternberg, Michael L. Alles et al. · IEEE Transactions on Nuclear Science · 2005 · 122 citations

Device Modeling, Hardware Security, Electrical Engineering +13

First observations of power MOSFET burnout with high energy neutrons

D.L. Oberg, J.L. Wert, E. Normand et al. · IEEE Transactions on Nuclear Science · 1996 · 98 citations

Electrical Engineering, Power Mosfet, Engineering +12

Neutron-induced single event burnout in high voltage electronics

E. Normand, J.L. Wert, D.L. Oberg et al. · IEEE Transactions on Nuclear Science · 1997 · 89 citations

Electrical Engineering, Engineering, Hardware Reliability +11

First Nondestructive Measurements of Power MOSFET Single Event Burnout Cross Sections

D.L. Oberg, J.L. Wert · IEEE Transactions on Nuclear Science · 1987 · 88 citations

Electrical Engineering, Reliability Engineering, Engineering +12

Single event upset and charge collection measurements using high energy protons and neutrons

E. Normand, D.L. Oberg, J.L. Wert et al. · IEEE Transactions on Nuclear Science · 1994 · 83 citations

Single Event Upset, Engineering, Nuclear Physics +23