Proceedings of the ... American Control Conference/Proceedings of the American Control Conference · 2007 · 16 citations · 10 references
EngineeringElectrical EngineeringMechanical EngineeringActuatorsMicroelectromechanical SystemsMicrofabricationAtomic Force MicroscopyControl SystemsControl TheoryElectrostatic ActuationElectrostatic ActuatorsMems ModelingDistributed Control ArchitecturesElectrostatic Actuation ModelingElectrostatic Mems ActuatorsElectrostatic Microelectromechanical SystemsFeedback Control Of Electrostatic ActuatorsMicrocantilever DesignMicropositioning SystemsModeling Of Electrostatic Actuators
This paper presents a basic model and control design of an array of electrostatically actuated microcantilevers that can be put to use for high throughput applications, such as, multi cantilever imaging applications in atomic force microscopy (AFM). We consider a model of infinite array which belongs to the class of spatially invariant systems, and design a H <sub xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">infin</sub> distributed controller while making use of the information from only the immediate neighbors. The performance of this controller is tested via simulations on a finite nonlinear model of the system. Based on the achieved resolution and bandwidth, the device holds high potential for AFM applications in contact mode such as, indenting, pushing, cutting, and lithography.
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Scanning force microscopy in the dynamic mode using microfabricated capacitive sensors
Nicolas Blanc, Juergen Brügger, N. F. de Rooij et al. · Journal of Vacuum Science & Technology B Microelectronics and Nanometer Structures Processing Measurement and Phenomena · 1996 · 111 citations · Full text
Engineering, Materials Science, Microelectromechanical Systems +16