Atomic Force Microscopy

Atomic Force Microscopy is a scanning probe microscopy technique that measures nanoscale topography and surface forces by detecting the deflection of a cantilever-tip assembly as it interacts with a sample surface through atomic and molecular interactions.

23.5K

Publications

1.4M

Citations

57.3K

Authors

5.9K

Institutions

Publications per year

2017–2026

3.5K

Authors

57.3K

  1. PK
    Paul K. Hansma

    University of California, Santa Barbara, United States

    107 publications · 17.6K citations

    59

    h-index

  2. BB
    Bharat Bhushan

    The Ohio State University, United States

    134 publications · 9.8K citations

    58

    h-index

  3. EM
    Ernst Meyer

    University of Basel, Switzerland

    170 publications · 12.7K citations

    58

    h-index

  4. CF
    C. F. Quate

    Stanford University, United States

    64 publications · 23.6K citations

    50

    h-index

  5. HB
    Hans‐Jürgen Butt

    Max Planck Institute for Polymer Research, Germany

    82 publications · 11.9K citations

    48

    h-index

1–5 of 57.3K

Venues

  1. Applied Physics Letters

    1.5K publications · 108.6K citations

    144

    h-index

  2. Langmuir

    1.4K publications · 87.1K citations

    136

    h-index

  3. Physical Review Letters

    PRL · 389 publications · 63.6K citations

    127

    h-index

  4. Biophysical Journal

    309 publications · 40.2K citations

    113

    h-index

  5. Nano Letters

    423 publications · 35K citations

    100

    h-index

1–5