Concepedia

Atomic Force Microscopy Calibration

Atomic Force Microscopy Calibration is a methodological framework that establishes traceable, quantitative relationships between the instrument's measured signals and the corresponding physical properties of the sample by correcting for systematic deviations in probe response, cantilever deflection, and scanner positioning accuracy specific to atomic force microscopy systems.

267

Publications

21.8K

Citations

849

Authors

329

Institutions

Publications per year

2017–2026

22

Parents

Publications

267

Calibration of atomic-force microscope tips

Jeffrey L. Hutter, John Bechhoefer · Review of Scientific Instruments · 1993 · 4.2K citations

, , +16

Calibration of rectangular atomic force microscope cantilevers

John E. Sader, James W. M. Chon, Paul Mulvaney · Review of Scientific Instruments · 1999 · 2.1K citations

, , +16

Method for the calibration of atomic force microscope cantilevers

John E. Sader, Ian Larson, Paul Mulvaney et al. · Review of Scientific Instruments · 1995 · 983 citations

, , +15

Calibration of frictional forces in atomic force microscopy

D. Frank Ogletree, R. W. Carpick, Miquel Salmerón · Review of Scientific Instruments · 1996 · 601 citations

, , +16

Comparison of calibration methods for atomic-force microscopy cantilevers

N. A. Burnham, Xun Chen, Chris S. Hodges et al. · Nanotechnology · 2002 · 455 citations

, , +15

1–5 of 267

Authors

849

  1. RG
    Ronald G. Dixson

    National Institute of Standards and Technology, United States

    10 publications · 229 citations

    10

    h-index

  2. JR
    Jon R. Pratt

    National Institute of Standards and Technology, United States

    9 publications · 470 citations

    9

    h-index

  3. RS
    Richard S. Gates

    National Institute of Standards and Technology, United States

    9 publications · 288 citations

    9

    h-index

  4. JE
    John E. Sader

    The University of Melbourne, Australia

    8 publications · 3.8K citations

    8

    h-index

  5. TK
    Tomizo Kurosawa

    National Institute of Advanced Industrial Science and Technology, Japan

    8 publications · 359 citations

    8

    h-index

1–5 of 849

Institutions

329

  1. National Institute of Standards and Technology

    Gaithersburg, United States

    19 h-index

    104 publications

    2.8K citations

  2. The University of Melbourne

    Melbourne, Australia

    12 h-index

    44 publications

    14.8K citations

  3. Centre National de la Recherche Scientifique

    Paris, France

    11 h-index

    40 publications

    1K citations

  4. National Physical Laboratory

    London, United Kingdom

    9 h-index

    22 publications

    1.3K citations

  5. National Institute of Advanced Industrial Science and Technology

    Tsukuba, Japan

    9 h-index

    41 publications

    1.1K citations

  6. Physikalisch-Technische Bundesanstalt

    Braunschweig, Germany

    7 h-index

    18 publications

    651 citations

  7. Worcester Polytechnic Institute

    Worcester, United States

    7 h-index

    21 publications

    2.6K citations

  8. KTH Royal Institute of Technology

    Stockholm, Sweden

    6 h-index

    12 publications

    1.1K citations

1–8 of 329

Venues

  1. Review of Scientific Instruments

    73 publications · 12.2K citations

    38

    h-index

  2. Measurement Science and Technology

    32 publications · 1.3K citations

    20

    h-index

  3. Nanotechnology

    23 publications · 1.9K citations

    19

    h-index

  4. Applied Physics Letters

    12 publications · 515 citations

    12

    h-index

  5. 11

    h-index

1–5