Concepedia

Ronald G. Dixson

RG

Statistics

Publications

52

Citations

1.4K

H-Index

24

Active since

1993

Affiliations

National Institute of Standards and Technology(Current)

University of Maryland, College Park

Yale University

Ronald G. Dixson is an author at National Institute of Standards and Technology specializing in metrology, engineering, and atomic force microscopy.

Publications per year

1993–2018

52

Publications

52

Determination of optimal parameters for CD-SEM measurement of line-edge roughness

Benjamin Bunday, Michael Bishop, Donald W. McCormack et al. · Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE · 2004 · 86 citations

, , +17

Precise measurement of the Lamb shift and fine structure of the 2<i>S</i>-2<i>P</i>transition in triplet helium

David Shiner, Ronald G. Dixson, Ping Zhao · Physical Review Letters · 1994 · 73 citations

, , +13

Scanning probe microscope dimensional metrology at NIST

John A. Kramar, Ronald G. Dixson, Ndubuisi G. Orji · Measurement Science and Technology · 2010 · 58 citations

, , +15

Higher order tip effects in traceable CD-AFM-based linewidth measurements

Ndubuisi G. Orji, Ronald G. Dixson · Measurement Science and Technology · 2007 · 56 citations

, , +11

Line edge roughness metrology using atomic force microscopes

Ndubuisi G. Orji, Theodore V. Vorburger, Joseph Fu et al. · Measurement Science and Technology · 2005 · 42 citations

, , +16

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