John A. Kramar

Statistics

Publications

Citations

1.2K

H-Index

Active since

1988

Affiliations

National Institute of Standards and Technology(Current)

National Taiwan University

Material Measurement Laboratory

California Institute of Technology

Theiss Research

John A. Kramar is an author at National Institute of Standards and Technology specializing in engineering, mechanical engineering, and instrumentation.

ORCID

Top concepts

EngineeringApplied PhysicsInstrumentationMicrofabricationMechanical EngineeringMicroscopyMeasurementCalibrationMaterial SciencePhysics

Publications per year

1988–2021

Publications

Dynamic light scattering distributions by any means

Natalia Farkas, John A. Kramar · Journal of Nanoparticle Research · 2021 · 129 citations · Full text

Review of SI traceable force metrology for instrumented indentation and atomic force microscopy

Jon R. Pratt, John A. Kramar, David B. Newell et al. · Measurement Science and Technology · 2005 · 106 citations

Materials Science, Atomic Force Microscopy, Quantitative Instrumented Indentation +15

Nanometre resolution metrology with the Molecular Measuring Machine

John A. Kramar · Measurement Science and Technology · 2005 · 89 citations

Engineering, Microscopy, Laser Fabrication +28

Band bending and the apparent barrier height in scanning tunneling microscopy

Michael Weimer, John A. Kramar, John D. Baldeschwieler · Physical review. B, Condensed matter · 1989 · 79 citations

Engineering, Microscopy, Semiconductor Device +16

Progress toward Système International d'Unités traceable force metrology for nanomechanics

Jon R. Pratt, Douglas T. Smith, David B. Newell et al. · Journal of materials research/Pratt's guide to venture capital sources · 2004 · 73 citations

Engineering, Micromechanics, Mechanical Design +8

1–5 of 28