Concepedia
1
Publications
83
Citations
H-Index
2004
Active since
Affiliations
National Institute of Standards and Technology(Current)
Donald W. McCormack is an author at National Institute of Standards and Technology.
Publications per year
2004–2004
Determination of optimal parameters for CD-SEM measurement of line-edge roughness
Benjamin Bunday, Michael Bishop, Donald W. McCormack et al. · Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE · 2004 · 83 citations
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