Atomic Force Microscopy Image Resolution

Atomic Force Microscopy Image Resolution is the metric that quantifies the smallest discernible detail in a topographic image acquired via atomic force microscopy, distinguishing itself from other imaging resolution metrics by accounting for probe-tip convolution, feedback system accuracy, and surface-sampling density specific to scanning probe modalities.

788

Publications

55.2K

Citations

2.5K

Authors

721

Institutions

Publications per year

2017–2026

103

Authors

2.5K

  1. PK
    Paul K. Hansma

    University of California, Santa Barbara, United States

    20 publications · 4.5K citations

    19

    h-index

  2. CF
    C. F. Quate

    Stanford University, United States

    14 publications · 3.4K citations

    14

    h-index

  3. TA
    Toshio Ando

    Kanazawa University, Japan

    13 publications · 1.7K citations

    13

    h-index

  4. DJ
    Daniel J. Müller

    ETH Zurich, Switzerland

    13 publications · 1.7K citations

    13

    h-index

  5. TF
    Takeshi Fukuma

    Kanazawa University, Japan

    14 publications · 1.6K citations

    13

    h-index

1–5 of 2.5K

Venues

  1. Applied Physics Letters

    68 publications · 6.8K citations

    35

    h-index

  2. Review of Scientific Instruments

    55 publications · 3.1K citations

    31

    h-index

  3. Ultramicroscopy

    35 publications · 1.2K citations

    21

    h-index

  4. Nanotechnology

    37 publications · 1.5K citations

    21

    h-index

  5. Biophysical Journal

    21 publications · 3.1K citations

    20

    h-index

1–5