R. C. Barrett

Atomic resolution with an atomic force microscope using piezoresistive detection

M. Tortonese, R. C. Barrett, C. F. Quate · Applied Physics Letters · 1993 · 638 citations

Engineering, Microscopy, Mechanical Engineering +20

Charge storage in a nitride-oxide-silicon medium by scanning capacitance microscopy

R. C. Barrett, C. F. Quate · Journal of Applied Physics · 1991 · 246 citations

Engineering, Microscopy, Capacitance Microscope +20

Improved atomic force microscope images using microcantilevers with sharp tips

S. Akamine, R. C. Barrett, C. F. Quate · Applied Physics Letters · 1990 · 218 citations

Engineering, Novel Force-sensing Microcantilevers, Microscopy +21

Optical scan-correction system applied to atomic force microscopy

R. C. Barrett, C. F. Quate · Review of Scientific Instruments · 1991 · 157 citations

Engineering, Microscopy, Measurement +17

Atomic force microscopy using a piezoresistive cantilever

M. Tortonese, Hirofumi Yamada, R. C. Barrett et al. · TRANSDUCERS '91: 1991 International Conference on Solid-State Sensors and Actuators. Digest of Technical Papers · 2002 · 134 citations

Atomic Force Microscopy, Engineering, Microscopy +20