Concepedia
Statistics
Publications
18
Citations
2K
H-Index
16
Active since
1985
Affiliations
Stanford University(Current)
IBM Research - Almaden
Washington University in St. Louis
IBM (United States)
R. C. Barrett is an author at Stanford University specializing in scanning probe microscopy, engineering, and atomic force microscopy.
Publications per year
1985–2017
Atomic resolution with an atomic force microscope using piezoresistive detection
M. Tortonese, R. C. Barrett, C. F. Quate · Applied Physics Letters · 1993 · 639 citations
Engineering, Materials Science, Physics +17
Charge storage in a nitride-oxide-silicon medium by scanning capacitance microscopy
R. C. Barrett, C. F. Quate · Journal of Applied Physics · 1991 · 246 citations
Engineering, Electrical Engineering, Materials Science +17
Improved atomic force microscope images using microcantilevers with sharp tips
S. Akamine, R. C. Barrett, C. F. Quate · Applied Physics Letters · 1990 · 218 citations
Natural Sciences, Materials Engineering, Materials Science +15
Optical scan-correction system applied to atomic force microscopy
R. C. Barrett, C. F. Quate · Review of Scientific Instruments · 1991 · 157 citations
Engineering, Mechanical Engineering, Actuators +12
Atomic force microscopy using a piezoresistive cantilever
M. Tortonese, Hirofumi Yamada, R. C. Barrett et al. · TRANSDUCERS '91: 1991 International Conference on Solid-State Sensors and Actuators. Digest of Technical Papers · 2002 · 134 citations
Engineering, Electrical Engineering, Microfabrication +16
1–5 of 18