M. Tortonese - Concepedia

Concepedia

Author

M. Tortonese

The University of Texas at Austin

Also Known As

M. Tortonese, Marco Tortonese

17

Publications

1.4K

Citations

12

H-Index

49

Concepts

All Affiliations

The University of Texas at Austin Stanford University American Standard (United States)

MT

About

M. Tortonese is an author at The University of Texas at Austin specializing in engineering, microfabrication, and microscopy.

Top Concepts

#	Concept	H-Index	Publications	Citations
1	Engineering	10	10	1.3K
2	Applied Physics	8	8	1.1K
3	Medicine	4	4	778
4	Education	3	3	216
5	Biomedical Engineering	1	1	85

M. Tortonese

×

12

Publications

1.4K

Citations

12

H-Index

	Year	Citations
Atomic resolution with an atomic force microscope using piezoresistive detection M. Tortonese, R. C. Barrett, C. F. Quate Applied Physics Letters EngineeringMicroscopyMechanical EngineeringElectron MicroscopyMicroscopy Method	1993	638
<title>Characterization of application-specific probes for SPMs</title> M. Tortonese, M. D. Kirk Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE EngineeringMicroscopyMeasurementMechanical EngineeringApplication-specific Probes	1997	182
Atomic force microscopy using a piezoresistive cantilever M. Tortonese, Hirofumi Yamada, R. C. Barrett, TRANSDUCERS '91: 1991 International Conference on Solid-State Sensors and Actuators. Digest of Technical Papers Atomic Force MicroscopyEngineeringMicroscopyMechanical EngineeringIntegrated Circuits	2002	134
Improved scanning ion-conductance microscope using microfabricated probes Craig Prater, Paul K. Hansma, M. Tortonese, Review of Scientific Instruments Materials SciencePrevious SicmsIon-conductance MicroscopeEngineeringMicroscopy	1991	85
Low temperature magnetic force microscope utilizing a piezoresistive cantilever Chunhao Yuan, E. Batalla, M. G. Zacher, Applied Physics Letters High Temperature SuperconductorsMagnetic Force GradientEngineeringMicroscopyMechanical Engineering	1994	73
Cantilevers and tips for atomic force microscopy M. Tortonese IEEE Engineering in Medicine and Biology Magazine	1997	71
Atomic force microscope using piezoresistive cantilevers and combined with a scanning electron microscope Ullrich Stahl, Chunhao Yuan, Alex de Lozanne, Applied Physics Letters EngineeringMicroscopyMechanical EngineeringSoft RoboticsMicroscopy Method	1994	54
Vortex images in thin films of YBa2Cu3O7−<i>x</i> and Bi2Sr2Ca1Cu2O8+<i>x</i> obtained by low-temperature magnetic force microscopy Chunhao Yuan, Alex de Lozanne, M. Tortonese, Journal of Vacuum Science & Technology B Microelectronics and Nanometer Structures Processing Measurement and Phenomena Superconducting MaterialMagnetic PropertiesEngineeringMicroscopyMagnetic Resonance	1996	40
Self-oscillating mode for frequency modulation noncontact atomic force microscopy Franz J. Gießibl, M. Tortonese Applied Physics Letters EngineeringMicroscopyMechanical EngineeringExternal ActuatorSelf-oscillating Mode	1997	27
100-nm-pitch standard characterization for metrology applications M. Tortonese, Jerry Prochazka, Paul Konicek, Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE EngineeringMeasurementEducationSilicon On InsulatorDimensional Metrology	2002	22

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