Low temperature magnetic force microscope utilizing a piezoresistive cantilever

Abstract

We have developed a low temperature magnetic force microscope capable of operation down to 6 K in vacuum by using piezoresistive cantilevers. We use the non-contact frequency modulation technique to detect the magnetic force gradient between an iron-coated tip and the sample. We demonstrate the operation of this new instrument by obtaining images of magnetic domains in VHS tape at room temperature, 77 and 6 K. This microscope is ideally suited for the characterization of thin films of high temperature superconductors.