Scanning Probe Microscopy

Scanning Probe Microscopy is a family of high-resolution surface characterization techniques in which a sharp, nanoscale physical probe is raster-scanned across a sample and local probe–sample interactions are measured to reconstruct topographical and related physical or chemical properties with nanometer to atomic spatial resolution.

18.1K

Publications

1M

Citations

38.3K

Authors

3.9K

Institutions

Publications per year

2017–2026

2.3K

Authors

38.3K

  1. SV
    Sergei V. Kalinin

    Oak Ridge National Laboratory, United States

    164 publications · 11.3K citations

    61

    h-index

  2. CF
    C. F. Quate

    Stanford University, United States

    78 publications · 24.7K citations

    54

    h-index

  3. EM
    Ernst Meyer

    University of Basel, Switzerland

    104 publications · 6.9K citations

    47

    h-index

  4. SJ
    Stephen Jesse

    Oak Ridge National Laboratory, United States

    97 publications · 7.1K citations

    47

    h-index

  5. PR
    Patrick R. Unwin

    University of Warwick, United Kingdom

    75 publications · 6.7K citations

    47

    h-index

1–5 of 38.3K

Venues

  1. Physical Review Letters

    PRL · 543 publications · 90.8K citations

    146

    h-index

  2. Applied Physics Letters

    1.5K publications · 97.9K citations

    140

    h-index

  3. Physical review. B, Condensed matter

    PRB · 608 publications · 50.1K citations

    111

    h-index

  4. Review of Scientific Instruments

    954 publications · 63.6K citations

    102

    h-index

  5. Science

    133 publications · 41.7K citations

    101

    h-index

1–5