Force Spectroscopy

Force Spectroscopy is a scanning probe microscopy technique that measures the interaction force between a probe tip and a sample surface as a function of their separation distance, enabling the characterization of mechanical, adhesive, and elastic properties at the nanoscale.

2K

Publications

121.2K

Citations

6.6K

Authors

1.5K

Institutions

Publications per year

2017–2026

490

Variants

Force-distance Spectroscopy

Authors

6.6K

  1. HE
    Hermann E. Gaub

    Ludwig-Maximilians-Universität München, Germany

    65 publications · 10.5K citations

    46

    h-index

  2. DJ
    Daniel J. Müller

    ETH Zurich, Switzerland

    46 publications · 3.6K citations

    33

    h-index

  3. MR
    Matthias Rief

    Technical University of Munich, Germany

    35 publications · 6.1K citations

    30

    h-index

  4. YF
    Yves F. Dufrêne

    UCLouvain, Belgium

    40 publications · 3K citations

    30

    h-index

  5. HL
    Hongbin Li

    University of British Columbia, Canada

    37 publications · 2.6K citations

    27

    h-index

1–5 of 6.6K

Venues

  1. Proceedings of the National Academy of Sciences

    PNAS · 73 publications · 10.8K citations

    54

    h-index

  2. Journal of the American Chemical Society

    JACS · 73 publications · 5.7K citations

    46

    h-index

  3. Langmuir

    139 publications · 6.1K citations

    45

    h-index

  4. Biophysical Journal

    83 publications · 5.2K citations

    39

    h-index

  5. ACS Nano

    50 publications · 3.1K citations

    31

    h-index

1–5